Temperature test
Temperature testing is a basic reliability evaluation test in which EUT is exposed to a constant environment of high or low temperature for a long period of time to evaluate the degradation behavior and performance deterioration of materials and components, enabling highly reproducible data acquisition.
High temperature storage test (HTS)
High Temperature Storage (HTS) is a test that evaluates the service life, performance degradation, heat resistance, and long-term reliability of products and materials in a short period of time by intentionally accelerating aging through prolonged exposure to high temperatures.
Low temperature storage test (LTS)
Low Temperature Storage (LTS) is a test that evaluates the service life, performance degradation, heat resistance, and long-term reliability of products and materials in a short period of time by intentionally accelerating aging through prolonged exposure to low temperatures.
High temperature operating test (HTO)
High Temperature Operating (HTO) Test is conducted to accelerate the degradation of products and materials by continuously applying voltage and current while exposing them to high temperatures. It is used to detect defects and to verify reliability and durability.
Low temperature operating test (LTO)
High Temperature Operating (HTO) Test is conducted to accelerate the degradation of products and materials by continuously applying voltage and current while exposing them to high temperatures. It is used to detect defects and to verify reliability and durability.