Basic performance
- Maximum Applied Voltage10kV (when HV unit is used)
- Maximum Measuring Resistance10000PΩ : 10000PΩ
- Measuring cycle20msec/CH
- Number of measurement channels8 to 128 channels (depending on configuration)
- Current measurement range3.2mA to 320pA
- output pulseV: ±100V (25kHz max.)
- SMU board configuration methodForce common method / Per-pin method
Product Features
Three types of enclosures lineup
- standard chassisSMU: Up to 8 SMU boards installed. Central model for research and evaluation.
- mini chassisCompact, yet capable of high-precision measurement. Suitable for development sites.
- SLIM enclosure: One-piece configuration for ease of installation in the smallest configuration.
SMU measurement board with industry-leading measurement accuracy
SIR13 is equipped with a proprietary SMU measurement board. It simultaneously measures insulation resistance, insulation characteristics, and migration behavior with high accuracy. Two configuration methods, the force common method and the per-pin method, are available to select the optimum measurement environment according to the test purpose.
SMU Board Type
Below is a list of specifications for various SMU boards and HV units that can be mounted on SIR13. The configuration can be flexibly combined according to the voltage range and number of measurement channels.
| board type | Applied voltage range | Number of measurement channels | Main applications |
|---|---|---|---|
| 250V force common | 0 to 250V | 16ch/SMU | For common specimens of one pole, accreditation evaluation, etc. |
| 250V per pin | 0 to 250V | 8ch/SMU | For independent application and high voltage evaluation |
| 500V Board | 0 to 500V | 8ch/SMU | For automotive and industrial applications |
| 1kV board | 0 to 1kV | 8ch/SMU | For high insulation material evaluation |
| HV Unit | Max. 10kV | 8 to 64ch | Pulse application supported (max. 25 kHz) |
configuration system
Force common method (250V force common board)
- Power Supply ConfigurationDC constant voltage source shared by 8-channel units, with a DC ammeter for each channel.
- Object of measurementFor batch monitoring of multiple samples, such as common samples of one pole and accreditation evaluation.
- useSuitable for: reliability testing, initial stage of material evaluation, etc.
Per-pin system (250V/250VHP/500V/1kV board)
- Power Supply Configuration: Independent DC constant voltage source and ammeter for each channel.
- Object of measurement: Samples requiring high voltage and independent application (e.g., automotive components, high-voltage materials).
- useSuitable for industrial applications such as: high voltage testing, insulation durability evaluation, etc.
applied voltage
Flexible support from material properties to high voltage testing by combining 250V/500V/1kV and other boards. Expandable up to 10kV.
Electrochemical Migration Measurement
SIR13 is designed for detailed time-based analysis of electrochemical migration (ECM) phenomena that cause insulation degradation and conduction failures. It records minute fluctuations in insulation resistance and leakage current with high-speed sampling to visualize the behavior from occurrence to termination.
Measurement and analysis functions
- Simultaneous monitoring of all CHs (20 msec cycle)Real-time recording of ECMs from their onset to their termination. Instantaneous leakage is not missed.
- Previus (Previous) functionIon Migration: Obtain data before and after the occurrence of ion migration (128 points before the occurrence + 151 points after the occurrence) to analyze the initial signs and progression mechanism.
- Automatic graphing functionECM: Graphs insulation resistance change over time to clearly visualize the point in time when ECM occurs.
- Phenomenon IdentificationThe occurrence and termination zones are determined for each individual channel, and changes over time are compared and analyzed.
- Analysis SupportMigration waveform data can be extracted for each individual CH.
Measurement mode
Three modes are available for ECM measurement, which can be selected according to the evaluation purpose.
- Time mode: Voltage application is continued until the expiration of the test time, and changes over time are evaluated.
- point trigger modeECM: Application is stopped only on channels where ECM occurrence is detected. Efficient data collection is possible.
- group trigger mode: Stop the application of the entire group, including the generation channel, and analyze the effect of localized generation.
Measurement Parameters
- Measuring cycleMinimum 20 msec (400 μsec for leak check)
- Resistance measurement rangeMax. 1000TΩ (when 1kV board is used)
- Current range3.2mA to 320pA (automatic switching possible)
Expansion Unit HV-1500/3000/6000/10000
By adding a high voltage unit, it is possible to apply up to 10kV. It is suitable for high-voltage evaluation tests in research and industrial fields and offers a wide range of range settings.
Basic performance
- Maximum Applied Voltage1.5kV/3kV/6kV/10kV
- Maximum Measuring Resistance1500PΩ / 3000PΩ / 6000PΩ / 10000PΩ : 1500PΩ / 3000PΩ / 6000PΩ / 10000PΩ
- Number of Channels8 to 64ch
- Applied voltage range25V/250V/HV
- Measuring current range3.2mA/320μA/3.2μA/32nA/320pA
- Printing methodPer-pin (1 power supply/ch)
±100V pulse stress board
Pulse output of up to 25 kHz is possible by using ±100 V pulse board. t1 to t4 time and voltage can be set to generate any waveform.