{"id":22790,"date":"2025-09-29T13:54:36","date_gmt":"2025-09-29T04:54:36","guid":{"rendered":"https:\/\/etac.jp\/?page_id=22790"},"modified":"2025-09-29T15:45:37","modified_gmt":"2025-09-29T06:45:37","slug":"test-standard","status":"publish","type":"page","link":"https:\/\/etac.jp\/en\/test-standard\/","title":{"rendered":"List of Test Standards"},"content":{"rendered":"<div class=\"wp-block-group has-background-background-color has-background has-global-padding is-layout-constrained wp-container-core-group-is-layout-67300a0c wp-block-group-is-layout-constrained\" style=\"padding-top:var(--wp--preset--spacing--large);padding-right:0;padding-bottom:var(--wp--preset--spacing--large);padding-left:0\">\n<div class=\"wp-block-group has-global-padding is-layout-constrained wp-container-core-group-is-layout-b2ff5e37 wp-block-group-is-layout-constrained\" style=\"margin-top:var(--wp--preset--spacing--xx-small);margin-bottom:var(--wp--preset--spacing--xx-small);padding-top:0;padding-right:0;padding-bottom:0;padding-left:0\"><h1 style=\"margin-top:var(--wp--preset--spacing--xx-small);margin-bottom:var(--wp--preset--spacing--xx-small);\" class=\"has-text-align-center wp-block-post-title has-xxxx-large-font-size\">List of Test Standards<\/h1>\n\n\n<div class=\"wp-block-uagb-advanced-heading uagb-block-693378c4\"><div class=\"uagb-heading-text\"><span data-spectra-dc-field=\"current_post|custom_field|custom_key|title_en\" class=\"uag-pro-dynamic-content\">Products<\/span><\/div><\/div>\n<\/div>\n<\/div>\n\n\n\n<div class=\"wp-block-uagb-container uagb-block-8c26f3aa alignfull uagb-is-root-container\"><div class=\"uagb-container-inner-blocks-wrap\">\n<div class=\"wp-block-group is-layout-flow wp-block-group-is-layout-flow\" style=\"padding-right:var(--wp--preset--spacing--medium);padding-left:var(--wp--preset--spacing--medium)\"><table class=\"test-standards-table\"><thead><tr><th>standard code<\/th><th>Standard name<\/th><th>explanatory note<\/th><\/tr><\/thead><tbody><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--neutral);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/cie-85\/\" data-tooltip=\"\" aria-label=\"CIE 85 \">CIE 85<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/cie-85\/\">CIE 85<\/a><\/td><td><\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--neutral);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/cie-85-table-4\/\" data-tooltip=\"\" aria-label=\"CIE 85 Table 4 \">CIE 85 Table 4<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/cie-85-table-4\/\">CIE 85 Table 4<\/a><\/td><td><\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-red);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/etsi-en-300019-2-4\/\" data-tooltip=\"ETSI\u8f38\u9001\u6761\u4ef6\u898f\u683c\" aria-label=\"ETSI EN 300019-2-4 ETSI Transport Conditions Standard\">ETSI EN 300019-2-4<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/etsi-en-300019-2-4\/\">ETSI Transport Condition Standards<\/a><\/td><td>ETSI EN 300 019-2-4 is an environmental test standard under \u201ctransport conditions\u201d defined by ETSI (European Telecommunications Standards Institute), which specifies the evaluation of resistance to temperature, humidity, shock, etc. that equipment is subjected to during transportation. In Japan, it is commonly referred to as \"ETSI's standard for transport conditions\" or \"EN 300 019-2-4 (transport).<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-cyan-blue);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-1\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\uff0d\u4f4e\u6e29\u8a66\u9a13\" aria-label=\"IEC 60068-2-1 Environmental testing - Low temperature testing\">IEC 60068-2-1<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-1\/\">Environmental Tests - Low Temperature Tests<\/a><\/td><td>IEC 60068-2-1 specifies test methods to verify the performance and reliability of electronic components and equipment when exposed to low-temperature environments, such as use, transportation, and storage in cold climates.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-cyan-blue);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-11\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\uff0d\u5869\u6c34\u30df\u30b9\u30c8\" aria-label=\"IEC 60068-2-11 Environmental testing - Salt water mist\">IEC 60068-2-11<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-11\/\">Environmental Tests - Saltwater Mist<\/a><\/td><td>IEC 60068-2-11 specifies that sodium chloride solution (5\u00b111 TP3T, pH 6.5 to 7.2) is sprayed at 35\u00b12\u2103 to check appearance deterioration, contact failure, and durability of protective film due to corrosion.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-cyan-blue);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-14\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\uff0d\u6e29\u5ea6\u5909\u5316\u8a66\u9a13\" aria-label=\"IEC 60068-2-14 Environmental testing - Temperature variation test\">IEC 60068-2-14<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-14\/\">Environmental Tests - Temperature Change Tests<\/a><\/td><td>IEC 60068-2-14 specifies that the risk of cracking, seal failure, and condensation due to thermal expansion differences should be evaluated by varying between set temperatures at a specified rate, and the design margin should be verified.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-cyan-blue);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-2\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\uff0d\u9ad8\u6e29\u8a66\u9a13\" aria-label=\"IEC 60068-2-2 Environmental testing - High temperature testing\">IEC 60068-2-2<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-2\/\">Environmental Tests - High Temperature Tests<\/a><\/td><td>IEC 60068-2-2 specifies the checking of the possibility of thermal degradation, drift, and resin deformation that may occur in electronic components and materials due to exposure to high temperature environments.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-cyan-blue);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-27\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\uff0d\u885d\u6483\u8a66\u9a13\" aria-label=\"IEC 60068-2-27 Environmental testing - Impact testing\">IEC 60068-2-27<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-27\/\">Environmental Testing - Impact Testing<\/a><\/td><td>IEC 60068-2-27 specifies that shock pulses such as a specified half-sine wave be applied to verify structural integrity and functional maintenance, and to verify resistance to transportation, dropping, and accidents.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-cyan-blue);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-29\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\uff0d\u30d0\u30f3\u30d7\u8a66\u9a13\" aria-label=\"IEC 60068-2-29 Environmental testing - Bump test\">IEC 60068-2-29<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-29\/\">Environmental Tests - Bump Tests<\/a><\/td><td>IEC 60068-2-29 specifies that repeated small impacts (bumps) are applied to evaluate fatigue and loosening of solder and contacts, and is useful for verifying the durability of connectors and small devices.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--neutral);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-3\/\" data-tooltip=\"\" aria-label=\"IEC 60068-2-3 \">IEC 60068-2-3<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-3\/\">IEC 60068-2-3<\/a><\/td><td><\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-cyan-blue);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-30\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\uff0d\u6e29\u6e7f\u5ea6\u30b5\u30a4\u30af\u30eb\u8a66\u9a13\" aria-label=\"IEC 60068-2-30 Environmental testing - Temperature and humidity cycling test\">IEC 60068-2-30<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-30\/\">Environmental Testing - Temperature and Humidity Cycling Test<\/a><\/td><td>IEC 60068-2-30 specifies that damp-heat cycling promotes condensation, corrosion, and insulation degradation, extracts weak points in the enclosure, board, and contacts, and is also applicable to mass production quality monitoring.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-cyan-blue);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-38\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\uff0d\u8907\u5408\u6e29\u6e7f\u5ea6\u30b5\u30a4\u30af\u30eb\u8a66\u9a13\" aria-label=\"IEC 60068-2-38 Environmental testing - Combined temperature and humidity cycling test\">IEC 60068-2-38<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-38\/\">Environmental Testing - Combined Temperature and Humidity Cycling Test<\/a><\/td><td>IEC 60068-2-38 specifies that the durability of materials, joints, and moving parts are evaluated under severe combined temperature and humidity conditions and is effective in reproducing combined failures.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-cyan-blue);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-42\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\u2015\u4e8c\u9178\u5316\u786b\u9ec4\u30ac\u30b9\u8a66\u9a13\uff08\u8150\u98df\u8a66\u9a13\uff09\" aria-label=\"IEC 60068-2-42 Environmental testing - Sulfur dioxide gas test (corrosion test)\">IEC 60068-2-42<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-42\/\">Environmental Tests - Sulfur Dioxide Gas Test (Corrosion Test)<\/a><\/td><td>IEC 60068-2-42 specifies a test method to evaluate the degradation of contact parts and conductors by exposing electronic components and materials to a corrosive gas: sulfur dioxide gas test (SO\u2082).<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-cyan-blue);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-43\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\u2015\u786b\u5316\u6c34\u7d20\u30ac\u30b9\u8a66\u9a13\uff08\u8150\u98df\u8a66\u9a13\uff09\" aria-label=\"IEC 60068-2-43 Environmental testing - Hydrogen sulfide gas test (corrosion test)\">IEC 60068-2-43<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-43\/\">Environmental Tests - Hydrogen Sulfide Gas Test (Corrosion Test)<\/a><\/td><td>IEC 60068-2-43 specifies a test method to evaluate sulfurization and degradation of contact areas and conductors by exposing electronic components and materials to a corrosive gas: hydrogen sulfide gas test (H\u2082S).<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--neutral);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-5\/\" data-tooltip=\"\" aria-label=\"IEC 60068-2-5 \">IEC 60068-2-5<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-5\/\">IEC 60068-2-5<\/a><\/td><td><\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-cyan-blue);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-6\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\uff0d\u6b63\u5f26\u6ce2\u632f\u52d5\u8a66\u9a13\" aria-label=\"IEC 60068-2-6 Environmental testing - Sinusoidal vibration test\">IEC 60068-2-6<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-6\/\">Environmental Tests - Sinusoidal Vibration Tests<\/a><\/td><td>IEC 60068-2-6 specifies that sinusoidal oscillations at swept frequency should be used to evaluate the resonance point and fixed strength to identify early signs of mechanism damage or contact failure.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-cyan-blue);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-60\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\uff0d\u8150\u98df\u8a66\u9a13\uff08\u30d5\u30ed\u30fc\u30ac\u30b9\u6cd5\uff09\" aria-label=\"IEC 60068-2-60 Environmental testing - Corrosion testing (flow gas method)\">IEC 60068-2-60<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-60\/\">Environmental Testing - Corrosion Testing (Flow Gas Method)<\/a><\/td><td>IEC 60068-2-60 specifies that contacts, plating, and conductors are to be evaluated for degradation by exposure to corrosive gases such as SO\u2082, NO\u2082, and Cl\u2082, and that they are to be used for long periods in air polluted environments.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-cyan-blue);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-64\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\uff0d\u30e9\u30f3\u30c0\u30e0\u632f\u52d5\u8a66\u9a13\" aria-label=\"IEC 60068-2-64 Environmental testing - Random vibration test\">IEC 60068-2-64<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-64\/\">Environmental Testing - Random Vibration Testing<\/a><\/td><td>IEC 60068-2-64 specifies that PSD simulating vibration during actual transportation and operation is applied to evaluate the durability and resonance response of solder, screws, and wiring, and is also useful for transportation package verification.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-cyan-blue);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-66\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\uff0d\u8907\u5408\u632f\u52d5\u8a66\u9a13\" aria-label=\"IEC 60068-2-66 Environmental testing - Combined vibration test\">IEC 60068-2-66<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-66\/\">Environmental Tests - Combined Vibration Tests<\/a><\/td><td>IEC 60068-2-66 specifies that temperature, humidity, and vibration be combined to evaluate functional maintenance and failure modes under combined stress and to verify synergistic effects in actual use.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--neutral);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-67\/\" data-tooltip=\"\" aria-label=\"IEC 60068-2-67 \">IEC 60068-2-67<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-67\/\">IEC 60068-2-67<\/a><\/td><td><\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-cyan-blue);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-78\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\uff0d\u5b9a\u5e38\u6e7f\u71b1\u8a66\u9a13\" aria-label=\"IEC 60068-2-78 Environmental testing - Steady-state wet heat test\">IEC 60068-2-78<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60068-2-78\/\">Environmental Tests - Steady State Moisture Heat Tests<\/a><\/td><td>IEC 60068-2-78 specifies that the product shall be exposed to certain high temperature and humidity conditions for a long period of time to check the moisture absorption, hydrolysis, and insulation degradation of the resin, and to apply it to basic evaluation of long-term reliability.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-cyan-blue);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60529\/\" data-tooltip=\"\u5916\u90ed\u306b\u3088\u308b\u4fdd\u8b77\u7b49\u7d1a\uff08IP\u30b3\u30fc\u30c9\uff09\" aria-label=\"IEC 60529 Degree of protection by enclosure (IP code)\">IEC 60529<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60529\/\">Protection class by outline (IP code)<\/a><\/td><td>IEC 60529 specifies that the dustproof and waterproof performance of electrical equipment enclosures shall be graded by IPXX and that the degree of dust penetration and water immersion resistance shall be quantitatively evaluated to demonstrate suitability for outdoor use.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-cyan-blue);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60749-33\/\" data-tooltip=\"\u534a\u5c0e\u4f53\u30c7\u30d0\u30a4\u30b9\uff0d\u52a0\u901f\u5ea6\u8a66\u9a13\" aria-label=\"IEC 60749-33 Semiconductor Devices - Acceleration Testing\">IEC 60749-33<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-60749-33\/\">Semiconductor Devices - Acceleration Testing<\/a><\/td><td>IEC 60749-33 specifies that semiconductor packages be exposed to an accelerated environment to evaluate the mechanical integrity of the joints, wire bonds, and mold.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-cyan-blue);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-62660-2\/\" data-tooltip=\"\u8eca\u8f09\u30ea\u30c1\u30a6\u30e0\u30a4\u30aa\u30f3\u4e8c\u6b21\u96fb\u6c60\u306e\u8a66\u9a13\uff0d\u6027\u80fd\u30fb\u5bff\u547d\" aria-label=\"IEC 62660-2 Testing of automotive lithium-ion rechargeable batteries - performance and lifetime\">IEC 62660-2<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iec-62660-2\/\">Testing of automotive lithium-ion rechargeable batteries - performance and lifetime<\/a><\/td><td>IEC 62660-2 specifies the evaluation of capacity, internal resistance, cycle life, and rate characteristics of automotive Li-ion cells and modules, and their use in understanding temperature dependence and degradation behavior.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--neutral);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/ipc-j-std-001\/\" data-tooltip=\"\" aria-label=\"IPC J-STD-001 \">IPC J-STD-001<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/ipc-j-std-001\/\">IPC J-STD-001<\/a><\/td><td>IPC's J-STD-001 standard<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--secondary);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/ipc-tm-650-2-6-14-1\/\" data-tooltip=\"\u30d7\u30ea\u30f3\u30c8\u57fa\u677f\uff0d\u5c0e\u4f53\u62b5\u6297\u8a66\u9a13\" aria-label=\"IPC-TM-650 2.6.14.1 Printed circuit board - Conductor resistance test\">IPC-TM-650 2.6.14.1<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/ipc-tm-650-2-6-14-1\/\">Printed Circuit Boards - Conductor Resistance Testing<\/a><\/td><td>IPC-TM-650 2.6.14.1 specifies that the resistance of wiring conductors shall be measured to evaluate variations in copper thickness, width, and plating quality and applied to mass production monitoring.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--secondary);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/ipc-tm-650-2-6-25\/\" data-tooltip=\"\u30d7\u30ea\u30f3\u30c8\u57fa\u677f\uff0d\u306f\u3093\u3060\u8010\u71b1\u8a66\u9a13\" aria-label=\"IPC-TM-650 2.6.25 Printed circuit boards - Soldering heat resistance test\">IPC-TM-650 2.6.25<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/ipc-tm-650-2-6-25\/\">Printed Circuit Board - Soldering Heat Resistance Test<\/a><\/td><td>IPC-TM-650 2.6.25 specifies that the resistance of boards to thermal loading in reflow and solder baths shall be evaluated to check for delamination and through-hole cracking.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--secondary);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/ipc-tm-650-2-6-3-3\/\" data-tooltip=\"\u30d7\u30ea\u30f3\u30c8\u57fa\u677f\uff0d\u7d76\u7e01\u62b5\u6297\u8a66\u9a13\" aria-label=\"IPC-TM-650 2.6.3.3 Printed circuit board - Insulation resistance test\">IPC-TM-650 2.6.3.3<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/ipc-tm-650-2-6-3-3\/\">Printed Circuit Boards - Insulation Resistance Testing<\/a><\/td><td>IPC-TM-650 2.6.3.3 specifies that the impact of substrate material and process differences on insulation should be evaluated to help understand humidity effects and CAF risks.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--secondary);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/ipc-tm-650-2-6-3-7\/\" data-tooltip=\"\u30d7\u30ea\u30f3\u30c8\u57fa\u677f\uff0d\u8010\u96fb\u5727\u8a66\u9a13\" aria-label=\"IPC-TM-650 2.6.3.7 Printed circuit boards - Withstand voltage test\">IPC-TM-650 2.6.3.7<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/ipc-tm-650-2-6-3-7\/\">Printed Circuit Boards - Withstanding Voltage Test<\/a><\/td><td>IPC-TM-650 2.6.3.7 specifies that high voltage shall be applied to check for dielectric breakdown and verify the effects of resin impregnation, interlayer distance, and process quality.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-red);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iso-12405-2\/\" data-tooltip=\"\u9053\u8def\u8eca\u4e21\u7528\u9ad8\u96fb\u5727\u30d0\u30c3\u30c6\u30ea\u30fc\u8a66\u9a13\u898f\u683c\uff08\u7b2c2\u90e8\uff09\" aria-label=\"ISO 12405-2 High voltage battery test standard for road vehicles (Part 2)\">ISO 12405-2<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iso-12405-2\/\">High Voltage Battery Testing Standard for Road Vehicles (Part 2)<\/a><\/td><td>ISO 12405-2 covers safety and performance evaluation of high-voltage batteries for EV\/HEV, and specifies verification similar to actual use under charge\/discharge, temperature, vibration, and shock conditions.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-red);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iso-1431-1\/\" data-tooltip=\"\u30b4\u30e0\uff0d\u8010\u30aa\u30be\u30f3\u6027\u8a66\u9a13\uff0d\u9759\u7684\u8a66\u9a13\" aria-label=\"ISO 1431-1 Rubber - Ozone Resistance Tests - Static Tests\">ISO 1431-1<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iso-1431-1\/\">Rubber - Ozone Resistance Test - Static Test<\/a><\/td><td>ISO 1431-1 specifies the selection of formulations and life prediction for sealing materials and exterior rubber parts by evaluating ozone resistance through observation of rubber crack initiation in an ozone atmosphere.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-red);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iso-16701\/\" data-tooltip=\"\u8150\u98df\u8a66\u9a13\uff0d\u5869\u6c34\u5674\u9727\u3068\u6e7f\u6f64\u4e7e\u71e5\u30b5\u30a4\u30af\u30eb\" aria-label=\"ISO 16701 Corrosion Testing - Salt Spray and Wet-Dry Cycles\">ISO 16701<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iso-16701\/\">Corrosion Testing - Salt Spray and Wet-Dry Cycles<\/a><\/td><td>ISO 16701 specifies the evaluation of automobile bodies and parts by reproducing realistic corrosion behavior in a combined cycle of salt spray, wetting, and drying.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-red);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iso-16750-3\/\" data-tooltip=\"\u9053\u8def\u8eca\u4e21\uff0d\u96fb\u6c17\u30fb\u96fb\u5b50\u6a5f\u5668\u306e\u74b0\u5883\u6761\u4ef6\u304a\u3088\u3073\u8a66\u9a13\uff0d\u6a5f\u68b0\u7684\u8ca0\u8377\" aria-label=\"ISO 16750-3 Road vehicles - Environmental conditions and tests of electrical and electronic equipment - Mechanical loads\">ISO 16750-3<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iso-16750-3\/\">Road Vehicles - Environmental Conditions and Testing of Electrical and Electronic Equipment - Mechanical Loads<\/a><\/td><td>ISO 16750-3 specifies that onboard electronic equipment should simulate the mechanical loads to which it is subjected and evaluate durability, resonance, and anchorage strength to ensure reliability when mounted in a vehicle.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-red);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iso-16750-4\/\" data-tooltip=\"\u9053\u8def\u8eca\u4e21\uff0d\u96fb\u6c17\u30fb\u96fb\u5b50\u6a5f\u5668\u306e\u74b0\u5883\u6761\u4ef6\u304a\u3088\u3073\u8a66\u9a13\uff0d\u6c17\u5019\u7684\u8ca0\u8377\" aria-label=\"ISO 16750-4 Road vehicles - Environmental conditions and tests of electrical and electronic equipment - Climatic loads\">ISO 16750-4<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iso-16750-4\/\">Road vehicles - Environmental conditions and testing of electrical and electronic equipment - Climatic loads<\/a><\/td><td>ISO 16750-4 covers temperature, humidity, and other climatic loads for onboard equipment and specifies the evaluation of functional maintenance and degradation behavior under cryogenic, high temperature, and temperature\/humidity cycles.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-red);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iso-19453-3\/\" data-tooltip=\"\u9053\u8def\u8eca\u4e21\uff0d\u9ad8\u96fb\u5727\u96fb\u5b50\u6a5f\u5668\u306e\u74b0\u5883\u6761\u4ef6\u304a\u3088\u3073\u8a66\u9a13\uff0d\u6a5f\u68b0\u7684\u8ca0\u8377\" aria-label=\"ISO 19453-3 Road vehicles - Environmental conditions and testing of high-voltage electronic equipment - Mechanical loading\">ISO 19453-3<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iso-19453-3\/\">Road Vehicles - Environmental Conditions and Testing of High Voltage Electronics - Mechanical Loads<\/a><\/td><td>ISO 19453-3 specifies the evaluation of mechanical resistance of high-voltage electronic equipment for EVs, defining vibration and shock conditions for each mounting position and application, and verifying durability and connection reliability.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-red);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iso-19453-4\/\" data-tooltip=\"\u9053\u8def\u8eca\u4e21\uff0d\u9ad8\u96fb\u5727\u96fb\u5b50\u6a5f\u5668\u306e\u74b0\u5883\u6761\u4ef6\u304a\u3088\u3073\u8a66\u9a13\uff0d\u6c17\u5019\u7684\u8ca0\u8377\" aria-label=\"ISO 19453-4 Road vehicles - Environmental conditions and testing of high-voltage electronic equipment - Climatic loading\">ISO 19453-4<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iso-19453-4\/\">Road Vehicles - Environmental Conditions and Testing of High Voltage Electronics - Climatic Loading<\/a><\/td><td>ISO 19453-4 covers the resistance of high-voltage equipment to climatic loading and specifies long-term evaluation of function, insulation, and safety under temperature, humidity, and condensation.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-red);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iso-20653\/\" data-tooltip=\"\u9053\u8def\u8eca\u4e21\uff0d\u5916\u88c5\u90e8\u54c1\u306e\u4fdd\u8b77\u7b49\u7d1a\uff08IP\u30b3\u30fc\u30c9\uff09\" aria-label=\"ISO 20653 Road vehicles - Protection class of exterior components (IP code)\">ISO 20653<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iso-20653\/\">Road Vehicles - Protection Class of Exterior Components (IP Code)<\/a><\/td><td>ISO 20653 defines dustproof and waterproof ratings for automotive applications and specifies automotive-specific test conditions that extend IEC 60529 to consider real-world driving environments, such as high-pressure washdown and muddy water.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-red);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iso-4892-2\/\" data-tooltip=\"\u30d7\u30e9\u30b9\u30c1\u30c3\u30af\uff0d\u5b9f\u9a13\u5ba4\u5149\u6e90\u306b\u3088\u308b\u66b4\u9732\u8a66\u9a13\u65b9\u6cd5\uff0d\u30a2\u30fc\u30af\u30e9\u30f3\u30d7\" aria-label=\"ISO 4892-2 Plastics - Exposure Test Methods Using Laboratory Light Sources - Arc Lamps\">ISO 4892-2<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iso-4892-2\/\">Plastics - Exposure Test Methods Using Laboratory Light Sources - Arc Lamp<\/a><\/td><td>ISO 4892-2 specifies accelerated evaluation of weather resistance such as color difference, gloss loss, and cracking of resins and coating films by reproducing a spectrum similar to sunlight with a xenon arc lamp.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-red);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iso-4892-3\/\" data-tooltip=\"\u30d7\u30e9\u30b9\u30c1\u30c3\u30af\uff0d\u5b9f\u9a13\u5ba4\u5149\u6e90\u306b\u3088\u308b\u66b4\u9732\u8a66\u9a13\u65b9\u6cd5\uff0d\u86cd\u5149UV\u30e9\u30f3\u30d7\" aria-label=\"ISO 4892-3 Plastics - Exposure test methods using laboratory light sources - Fluorescent UV lamps\">ISO 4892-3<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iso-4892-3\/\">Plastics - Exposure Test Methods Using Laboratory Light Sources - Fluorescent UV Lamps<\/a><\/td><td>ISO 4892-3 specifies that UV degradation be reproduced by fluorescent UV lamps and that the occurrence of yellowing, cracking, and strength loss be compared over a short period of time to obtain an index of outdoor durability.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-red);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/iso-9227\/\" data-tooltip=\"\u5869\u6c34\u5674\u9727\u8a66\u9a13\" aria-label=\"ISO 9227 Salt spray test\">ISO 9227<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/iso-9227\/\">Salt spray test<\/a><\/td><td>ISO 9227 specifies that the corrosion resistance of metals and coatings be evaluated under conditions such as neutral salt spray (NSS) and used for relative comparisons between treatments and for monitoring the quality of surface treatments.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--pale-cyan-blue);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jaso-d-014-3\/\" data-tooltip=\"\u81ea\u52d5\u8eca\u90e8\u54c1\uff0d\u74b0\u5883\u8a66\u9a13\uff0d\u632f\u52d5\" aria-label=\"JASO D 014-3 Automotive parts - Environmental testing - Vibration\">JASO D 014-3<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jaso-d-014-3\/\">Automotive Components - Environmental Testing - Vibration<\/a><\/td><td>JASO D 014-3 defines vibration test conditions for automotive components and specifies that durability should be evaluated with profiles that assume mounting locations and vehicle types.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--pale-cyan-blue);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jaso-d-014-4\/\" data-tooltip=\"\u81ea\u52d5\u8eca\u90e8\u54c1\uff0d\u74b0\u5883\u8a66\u9a13\uff0d\u6c17\u5019\" aria-label=\"JASO D 014-4 Automotive parts - Environmental testing - Climate\">JASO D 014-4<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jaso-d-014-4\/\">Automotive Components - Environmental Testing - Climate<\/a><\/td><td>JASO D 014-4 specifies the evaluation conditions for climatic loads (temperature and humidity) of on-board components and specifies that seasonal variations in actual road conditions should be simulated.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--pale-cyan-blue);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jaso-d-616\/\" data-tooltip=\"\u8eca\u8f09\u30ea\u30c1\u30a6\u30e0\u30a4\u30aa\u30f3\u96fb\u6c60\u8a66\u9a13\" aria-label=\"JASO D 616 Automotive Lithium Ion Battery Testing\">JASO D 616<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jaso-d-616\/\">Automotive Lithium Ion Battery Testing<\/a><\/td><td>JASO D 616 defines performance and safety tests for automotive Li-ion batteries and specifies evaluation of short circuit and overcharge protection, cycle life, etc.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--pale-cyan-blue);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jaso-d-618\/\" data-tooltip=\"\u96fb\u88c5\u54c1\u306e\u9632\u6c34\u8a66\u9a13\" aria-label=\"JASO D 618 Waterproofing Tests for Electrical Appliances\">JASO D 618<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jaso-d-618\/\">Waterproof testing of electrical components<\/a><\/td><td>JASO D 618 specifies that the waterproof performance of in-vehicle electrical components shall be evaluated to confirm that the functionality can be maintained against actual vehicle washing, splashing, and flooding.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--pale-cyan-blue);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jaso-m-609\/\" data-tooltip=\"\u81ea\u52d5\u8eca\u7528\u91d1\u5c5e\u6750\u6599\u8a66\u9a13\" aria-label=\"JASO M 609 Automotive Metals Testing\">JASO M 609<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jaso-m-609\/\">Automotive Metals Testing<\/a><\/td><td>JASO M 609 is a test suite that evaluates the mechanical and corrosion resistance properties of automotive metallic materials, and specifies the use of these materials in the selection of materials for car body and chassis components.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--neutral);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jedec-jesd22-a100\/\" data-tooltip=\"\" aria-label=\"JEDEC JESD22-A100 \">JEDEC JESD22-A100<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jedec-jesd22-a100\/\">JEDEC JESD22-A100<\/a><\/td><td><\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-purple);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jedec-jesd22-a101\/\" data-tooltip=\"\u52a0\u901f\u6e7f\u71b1\u8a66\u9a13\uff08THB\/HAST\uff09\" aria-label=\"JEDEC JESD22-A101 Accelerated Hygrothermal Test (THB\/HAST)\">JEDEC JESD22-A101<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jedec-jesd22-a101\/\">Accelerated moist heat test (THB\/HAST)<\/a><\/td><td>JEDEC JESD22-A101 specifies that accelerated tests with and without bias at high temperature and high humidity are to be conducted to evaluate corrosion, electrolytic migration, and insulation degradation, and used to estimate activation energy.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-purple);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jedec-jesd22-a102\/\" data-tooltip=\"\u9ad8\u6e29\u4fdd\u5b58\u8a66\u9a13\uff08HTS\uff09\" aria-label=\"JEDEC JESD22-A102 High temperature storage test (HTS)\">JEDEC JESD22-A102<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jedec-jesd22-a102\/\">High temperature storage test (HTS)<\/a><\/td><td>JEDEC JESD22-A102 specifies that the effects of material degradation, diffusion, and package stress due to high temperature storage should be evaluated and used to estimate storage life.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--neutral);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jedec-jesd22-a103\/\" data-tooltip=\"\" aria-label=\"JEDEC JESD22-A103 \">JEDEC JESD22-A103<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jedec-jesd22-a103\/\">JEDEC JESD22-A103<\/a><\/td><td><\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-purple);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jedec-jesd22-a104\/\" data-tooltip=\"\u6e29\u5ea6\u30b5\u30a4\u30af\u30eb\u8a66\u9a13\uff08TC\uff09\" aria-label=\"JEDEC JESD22-A104 Temperature Cycling Test (TC)\">JEDEC JESD22-A104<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jedec-jesd22-a104\/\">Temperature Cycling Test (TC)<\/a><\/td><td>JEDEC JESD22-A104 specifies that thermal fatigue of wire bonds, solder joints, and resins should be evaluated under cyclic temperature changes at high and low temperatures, and acceleration conditions should be defined by frequency and \u0394T.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-purple);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jedec-jesd22-a105\/\" data-tooltip=\"\u30d1\u30ef\u30fc\u30b5\u30a4\u30af\u30eb\u8a66\u9a13\" aria-label=\"JEDEC JESD22-A105 Power Cycle Test\">JEDEC JESD22-A105<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jedec-jesd22-a105\/\">Power Cycle Test<\/a><\/td><td>JEDEC JESD22-A105 specifies that devices be repeatedly energized to self-heat and cool to evaluate thermal fatigue of solder, wire, and leadframe.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-purple);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jedec-jesd22-a106\/\" data-tooltip=\"\u71b1\u885d\u6483\u8a66\u9a13\uff08TST\uff09\" aria-label=\"JEDEC JESD22-A106 Thermal Shock Test (TST)\">JEDEC JESD22-A106<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jedec-jesd22-a106\/\">Thermal Shock Testing (TST)<\/a><\/td><td>JEDEC JESD22-A106 specifies the evaluation of resistance to thermal shock-induced defects such as resin cracks and solder cracks caused by sudden temperature changeover.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-purple);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jedec-jesd22-a108\/\" data-tooltip=\"\u9ad8\u6e29\u52d5\u4f5c\u5bff\u547d\u8a66\u9a13\uff08HTOL\uff09\" aria-label=\"JEDEC JESD22-A108 High Temperature Operating Life Test (HTOL)\">JEDEC JESD22-A108<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jedec-jesd22-a108\/\">High Temperature Operating Life Test (HTOL)<\/a><\/td><td>JEDEC JESD22-A108 specifies that the device should be operated under high-temperature energization for extended periods of time to evaluate the accelerated occurrence of initial and wear failures and to model failure physics.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-purple);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jedec-jesd22-a110\/\" data-tooltip=\"\u9ad8\u5ea6\u52a0\u901f\u5bff\u547d\u8a66\u9a13\uff08HAST\uff09\" aria-label=\"JEDEC JESD22-A110 Highly Accelerated Life Test (HAST)\">JEDEC JESD22-A110<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jedec-jesd22-a110\/\">Highly Accelerated Life Test (HAST)<\/a><\/td><td>JEDEC JESD22-A110 specifies that corrosion and ion migration must be accelerated in a high temperature and humidity environment under high pressure for a short period of time to ascertain moisture resistance reliability.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-purple);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jedec-jesd22-a118\/\" data-tooltip=\"\u306f\u3093\u3060\u4ed8\u3051\u8010\u71b1\u8a66\u9a13\" aria-label=\"JEDEC JESD22-A118 Soldering Heat Resistance Test\">JEDEC JESD22-A118<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jedec-jesd22-a118\/\">Soldering Heat Resistance Test<\/a><\/td><td>JEDEC JESD22-A118 specifies the evaluation of resistance to reflow and solder bath thermal history to check for package cracks, solder rise, and voids.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-purple);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jedec-jesd22-a119\/\" data-tooltip=\"\u5b9a\u5e38\u72b6\u614b\u306e\u9ad8\u6e29\u9ad8\u6e7f\u30d0\u30a4\u30a2\u30b9\u8a66\u9a13\" aria-label=\"JEDEC JESD22-A119 High temperature and humidity bias test at steady state\">JEDEC JESD22-A119<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jedec-jesd22-a119\/\">Steady-state high temperature and humidity bias test<\/a><\/td><td>JESD22-A119 specifies a method for evaluating humidity-induced degradation and failure by continuously testing semiconductor devices under a constant temperature and humidity environment with a bias voltage applied.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jeita-ed-4701-100b\/\" data-tooltip=\"\u96fb\u5b50\u90e8\u54c1\u74b0\u5883\u8a66\u9a13\uff0d\u4e00\u822c\u6761\u4ef6\" aria-label=\"JEITA ED-4701\/100B Environmental Tests for Electronic Components - General Conditions\">JEITA ED-4701\/100B<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jeita-ed-4701-100b\/\">Environmental Testing of Electronic Components - General Conditions<\/a><\/td><td>JEITA ED-4701\/100B specifies to organize general conditions for environmental testing of electronic components and to clarify common definitions, pretreatment and judgment criteria for each test.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jeita-ed-4701-200\/\" data-tooltip=\"\u96fb\u5b50\u90e8\u54c1\u74b0\u5883\u8a66\u9a13\uff0d\u8010\u5019\u6027\" aria-label=\"JEITA ED-4701\/200 Environmental Tests for Electronic Components - Weather Resistance\">JEITA ED-4701\/200<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jeita-ed-4701-200\/\">Environmental Testing of Electronic Components - Weather Resistance<\/a><\/td><td>JEITA ED-4701\/200 provides guidelines for evaluating weather resistance for electronic components and specifies that light degradation in outdoor and window exposure should be comparable.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jeita-et-7407\/\" data-tooltip=\"\u96fb\u5b50\u90e8\u54c1\uff0d\u71b1\u885d\u6483\u8a66\u9a13\" aria-label=\"JEITA ET-7407 Electronic Components - Thermal Shock Test\">JEITA ET-7407<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jeita-et-7407\/\">Electronic Components - Thermal Shock Testing<\/a><\/td><td>JEITA ET-7407 specifies the evaluation of resistance of solders, resins, and joints to thermal stresses by means of a two-tank test in which a rapid transfer between a high-temperature bath and a low-temperature bath is performed.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jeita-et-7409\/\" data-tooltip=\"\u96fb\u5b50\u90e8\u54c1\uff0d\u8010\u6e7f\u8a66\u9a13\" aria-label=\"JEITA ET-7409 Electronic Components - Moisture Resistance Test\">JEITA ET-7409<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jeita-et-7409\/\">Electronic Components - Moisture Resistance Testing<\/a><\/td><td>JEITA ET-7409 specifies that the evaluation of moisture absorption, corrosion, and insulation degradation under high temperature and humidity and temperature\/humidity cycling should contribute to ensuring reliability after mounting.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-0920\/\" data-tooltip=\"\u4fdd\u8b77\u7b49\u7d1a\uff08IP\u30b3\u30fc\u30c9\uff09\" aria-label=\"JIS C 0920 protection class (IP code)\">JIS C 0920<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-0920\/\">Protection class (IP code)<\/a><\/td><td>JIS C 0920 is an IP rating according to the Japanese Industrial Standards, which clarifies domestic application while maintaining consistency with IEC 60529, and specifies that products must demonstrate compliance with protection ratings.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-5016\/\" data-tooltip=\"\u96fb\u7dda\u306e\u7d76\u7e01\u8010\u96fb\u5727\u8a66\u9a13\" aria-label=\"JIS C 5016 Dielectric withstanding voltage test of electric wires\">JIS C 5016<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-5016\/\">Dielectric Withstanding Voltage Test of Wire<\/a><\/td><td>JIS C 5016 specifies basic withstand voltage evaluation for electrical safety and quality assurance by applying a specified voltage to electric wires to check for dielectric breakdown.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-5402\/\" data-tooltip=\"\u96fb\u5b50\u90e8\u54c1\uff0d\u63a5\u7d9a\u8a66\u9a13\" aria-label=\"JIS C 5402 Electronic components - Connection tests\">JIS C 5402<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-5402\/\">Electronic Components - Connection Testing<\/a><\/td><td>JIS C 5402 specifies quality indices that evaluate the contact resistance, insertion\/extraction endurance, vibration resistance, etc. of connectors and other equipment to indicate the connection reliability of wiring and terminals.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-60068-2-1\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\uff0d\u4f4e\u6e29\u8a66\u9a13\" aria-label=\"JIS C 60068-2-1 Environmental tests-Low temperature tests\">JIS C 60068-2-1<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-60068-2-1\/\">Environmental Tests - Low Temperature Tests<\/a><\/td><td>JIS C 60068-2-1 is the JIS version of IEC 60068-2-1, which specifies that changes in activation, function, and mechanical strength due to exposure to low temperatures should be checked to determine suitability under cold conditions.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-60068-2-14\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\uff0d\u6e29\u5ea6\u5909\u5316\u8a66\u9a13\" aria-label=\"JIS C 60068-2-14 Environmental tests-Temperature change test\">JIS C 60068-2-14<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-60068-2-14\/\">Environmental Tests - Temperature Change Tests<\/a><\/td><td>JIS C 60068-2-14 specifies that cracks and seal failures due to thermal expansion differences should be evaluated by repeatedly raising and lowering the temperature to help visualize design margins.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-60068-2-2\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\uff0d\u9ad8\u6e29\u8a66\u9a13\" aria-label=\"JIS C 60068-2-2 Environmental tests - High temperature tests\">JIS C 60068-2-2<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-60068-2-2\/\">Environmental Tests - High Temperature Tests<\/a><\/td><td>JIS C 60068-2-2 is the JIS version of IEC 60068-2-2 and specifies that thermal degradation and performance drift caused by exposure to high temperatures should be evaluated to validate materials and design.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-60068-2-27\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\uff0d\u885d\u6483\u8a66\u9a13\" aria-label=\"JIS C 60068-2-27 Environmental tests-Impact test\">JIS C 60068-2-27<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-60068-2-27\/\">Environmental Testing - Impact Testing<\/a><\/td><td>JIS C 60068-2-27 specifies that the evaluation of structural damage, disconnection, or functional failure by applying a specified shock for a short period of time should be applied to ascertain the risk during transportation or drop.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-60068-2-29\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\uff0d\u30d0\u30f3\u30d7\u8a66\u9a13\" aria-label=\"JIS C 60068-2-29 Environmental tests-Bump test\">JIS C 60068-2-29<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-60068-2-29\/\">Environmental Tests - Bump Tests<\/a><\/td><td>JIS C 60068-2-29 specifies that the test is effective for long-term durability verification of small devices and contacts by evaluating fatigue and loosening due to repeated small impacts.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--neutral);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-60068-2-3\/\" data-tooltip=\"\" aria-label=\"JIS C 60068-2-3 \">JIS C 60068-2-3<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-60068-2-3\/\">JIS C 60068-2-3<\/a><\/td><td><\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-60068-2-30\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\uff0d\u6e29\u6e7f\u5ea6\u30b5\u30a4\u30af\u30eb\u8a66\u9a13\" aria-label=\"JIS C 60068-2-30 Environmental testing - Temperature and humidity cycling test\">JIS C 60068-2-30<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-60068-2-30\/\">Environmental Testing - Temperature and Humidity Cycling Test<\/a><\/td><td>JIS C 60068-2-30 specifies that temperature and humidity should be varied periodically to promote condensation and corrosion, which is useful for extracting weak points of enclosures, boards, and contacts and for monitoring the quality of mass production.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-60068-2-38\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\uff0d\u8907\u5408\u6e29\u6e7f\u5ea6\u30b5\u30a4\u30af\u30eb\u8a66\u9a13\" aria-label=\"JIS C 60068-2-38 Environmental testing-Combined temperature and humidity cycle test\">JIS C 60068-2-38<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-60068-2-38\/\">Environmental Testing - Combined Temperature and Humidity Cycling Test<\/a><\/td><td>JIS C 60068-2-38 specifies that the combined application of temperature and humidity is effective in extracting the deterioration of joints and moving parts and reproducing combined failure modes.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-60068-2-6\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\uff0d\u6b63\u5f26\u6ce2\u632f\u52d5\u8a66\u9a13\" aria-label=\"JIS C 60068-2-6 Environmental tests-Sinusoidal vibration test\">JIS C 60068-2-6<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-60068-2-6\/\">Environmental Tests - Sinusoidal Vibration Tests<\/a><\/td><td>JIS C 60068-2-6 specifies that sinusoidal sweeps are used to extract resonance and fixing weak points and to verify the immunity of mounting, enclosure, and solder joints.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-60068-2-64\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\uff0d\u30e9\u30f3\u30c0\u30e0\u632f\u52d5\u8a66\u9a13\" aria-label=\"JIS C 60068-2-64 Environmental tests-Random vibration test\">JIS C 60068-2-64<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-60068-2-64\/\">Environmental Testing - Random Vibration Testing<\/a><\/td><td>JIS C 60068-2-64 specifies that the durability of structure, wiring, and junction is evaluated by random vibration assuming transportation and operation, and is also used for validation of package design.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-60068-2-78\/\" data-tooltip=\"\u74b0\u5883\u8a66\u9a13\uff0d\u5b9a\u5e38\u6e7f\u71b1\u8a66\u9a13\" aria-label=\"JIS C 60068-2-78 Environmental testing-Steady-state wet heat test\">JIS C 60068-2-78<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-c-60068-2-78\/\">Environmental Tests - Steady State Moisture Heat Tests<\/a><\/td><td>JIS C 60068-2-78 specifies that this test is the base for long-term reliability evaluation by checking insulation degradation and resin deterioration after exposure to steady-state conditions of high temperature and humidity.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--neutral);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-h-8502\/\" data-tooltip=\"\" aria-label=\"JIS H 8502 \">JIS H 8502<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-h-8502\/\">JIS H 8502<\/a><\/td><td><\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-k-5600-7-5\/\" data-tooltip=\"\u5857\u6599\uff0d\u8010\u5019\u6027\u8a66\u9a13\uff08\u30ad\u30bb\u30ce\u30f3\u30e9\u30f3\u30d7\uff09\" aria-label=\"JIS K 5600-7-5 Coatings-Weatherability test (xenon lamp)\">JIS K 5600-7-5<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-k-5600-7-5\/\">Paint - Weathering Resistance Test (Xenon Lamp)<\/a><\/td><td>JIS K 5600-7-5 specifies that outdoor light is reproduced by xenon lamps to evaluate deterioration of the paint film, such as fading, gloss, and cracking, and is applied to compare paint specifications.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-k-5600-7-7\/\" data-tooltip=\"\u5857\u6599\uff0d\u8010\u5019\u6027\u8a66\u9a13\uff08UV\u30e9\u30f3\u30d7\uff09\" aria-label=\"JIS K 5600-7-7 Coatings-Weatherability test (UV lamp)\">JIS K 5600-7-7<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-k-5600-7-7\/\">Paint - Weathering Resistance Test (UV Lamp)<\/a><\/td><td>JIS K 5600-7-7 specifies that UV degradation is accelerated by UV lamps to determine outdoor durability by comparing the occurrence of yellowing, chalking, and microcracks.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-k-6259\/\" data-tooltip=\"\u30b4\u30e0\uff0d\u30aa\u30be\u30f3\u52a3\u5316\u8a66\u9a13\" aria-label=\"JIS K 6259 rubber - Ozone degradation test\">JIS K 6259<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-k-6259\/\">Rubber - Ozone Degradation Test<\/a><\/td><td>JIS K 6259 specifies that crack initiation of rubber should be evaluated in an ozone environment and used to verify the effectiveness of compounding, plasticizers, weathering aids, etc.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-k-7161\/\" data-tooltip=\"\u30d7\u30e9\u30b9\u30c1\u30c3\u30af\uff0d\u5f15\u5f35\u8a66\u9a13\u65b9\u6cd5\" aria-label=\"JIS K 7161 Plastics - Tensile test method\">JIS K 7161<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-k-7161\/\">Plastics - Tensile Testing Methods<\/a><\/td><td>JIS K 7161 specifies that the tensile strength, modulus of elasticity, and elongation at break of resins should be evaluated to provide a basis for material grade selection and design allowances.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-k-7162\/\" data-tooltip=\"\u30d7\u30e9\u30b9\u30c1\u30c3\u30af\uff0d\u66f2\u3052\u8a66\u9a13\u65b9\u6cd5\" aria-label=\"JIS K 7162 Plastics - Bending test method\">JIS K 7162<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-k-7162\/\">Plastics - Bending Test Methods<\/a><\/td><td>JIS K 7162 specifies test methods for evaluating the flexural strength and flexural modulus of resins, and specifies their use in optimizing rib and plate thickness design.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-k-7164\/\" data-tooltip=\"\u30d7\u30e9\u30b9\u30c1\u30c3\u30af\uff0d\u5727\u7e2e\u8a66\u9a13\u65b9\u6cd5\" aria-label=\"JIS K 7164 Plastics - Compression test method\">JIS K 7164<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-k-7164\/\">Plastics - Compression Test Methods<\/a><\/td><td>JIS K 7164 specifies that the compressive strength and modulus of elasticity of resins are measured and are extremely useful for detailed assessment of the soundness and buckling risk of supports.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-z-0200\/\" data-tooltip=\"\u5305\u88c5\u898f\u683c\uff0d\u4e00\u822c\u8a66\u9a13\u65b9\u6cd5\" aria-label=\"JIS Z 0200 Packaging standards-General test methods\">JIS Z 0200<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-z-0200\/\">Packaging Standards-General Test Methods<\/a><\/td><td>JIS Z 0200 specifies general tests on packaging materials and methods to evaluate their moisture-proof and protective performance during transportation and storage to help reduce the risk of damage.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-z-0232\/\" data-tooltip=\"\u5305\u88c5\u898f\u683c\uff0d\u9632\u6e7f\u5305\u88c5\" aria-label=\"JIS Z 0232 Packaging standards - Moisture-proof packaging\">JIS Z 0232<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-z-0232\/\">Packaging Standard - Moisture-proof packaging<\/a><\/td><td>JIS Z 0232 specifies the design and testing methods for moisture-proof packaging, and stipulates that it must ensure transportation quality by controlling corrosion and moisture absorption deterioration caused by moisture.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-z-2241\/\" data-tooltip=\"\u91d1\u5c5e\u6750\u6599\uff0d\u5f15\u5f35\u8a66\u9a13\u65b9\u6cd5\" aria-label=\"JIS Z 2241 Metallic materials - Tensile test methods\">JIS Z 2241<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-z-2241\/\">Metallic Materials - Tensile Testing Methods<\/a><\/td><td>JIS Z 2241 specifies that the tensile strength, yield point, elongation, etc. of metals should be measured to provide basic data for material selection, setting design tolerances, and quality assurance.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-z-2244\/\" data-tooltip=\"\u91d1\u5c5e\u6750\u6599\uff0d\u786c\u3055\u8a66\u9a13\uff08\u30d6\u30ea\u30cd\u30eb\uff09\" aria-label=\"JIS Z 2244 Metallic materials - Hardness testing (Brinell)\">JIS Z 2244<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-z-2244\/\">Metallic Materials - Hardness Testing (Brinell)<\/a><\/td><td>JIS Z 2244 specifies that Brinell hardness should be measured to evaluate the deformation resistance of materials and used as an index for heat treatment conditions and acceptance inspection.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-z-2248\/\" data-tooltip=\"\u91d1\u5c5e\u6750\u6599\uff0d\u786c\u3055\u8a66\u9a13\uff08\u30d3\u30c3\u30ab\u30fc\u30b9\uff09\" aria-label=\"JIS Z 2248 Metallic materials - Hardness testing (Vickers)\">JIS Z 2248<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-z-2248\/\">Metallic Materials - Hardness Testing (Vickers)<\/a><\/td><td>JIS Z 2248 specifies that Vickers hardness is applied to the evaluation of measured surface modified layers and thin plate materials, and is also applicable to micro hardness testers to provide basic data for material selection and quality control.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-z-2330\/\" data-tooltip=\"\u975e\u7834\u58ca\u8a66\u9a13\uff0d\u6d78\u900f\u63a2\u50b7\u8a66\u9a13\" aria-label=\"JIS Z 2330 Nondestructive testing - Penetrant testing\">JIS Z 2330<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-z-2330\/\">Nondestructive Testing - Penetrant Testing<\/a><\/td><td>JIS Z 2330 specifies the use of penetrant and development to detect surface opening defects and to visualize microdefects such as welds and castings.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--light-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-z-2371\/\" data-tooltip=\"\u5869\u6c34\u5674\u9727\u8a66\u9a13\" aria-label=\"JIS Z 2371 Salt spray test\">JIS Z 2371<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jis-z-2371\/\">Salt spray test<\/a><\/td><td>JIS Z 2371 is the JIS version of the salt spray test, which specifies that the corrosion resistance of plating, coating, and base materials should be compared and evaluated to help optimize surface treatment conditions.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--pale-cyan-blue);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/jpca-et01-09\/\" data-tooltip=\"\u30d7\u30ea\u30f3\u30c8\u57fa\u677f\u4fe1\u983c\u6027\u8a66\u9a13\u898f\u683c\u7fa4\" aria-label=\"JPCA-ET01 to 09 Printed Circuit Board Reliability Test Standards\">JPCA-ET01 to 09<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/jpca-et01-09\/\">PCB Reliability Test Standards<\/a><\/td><td>JPCA-ET01 to 09 are a group of board reliability standards of the Japan Electronics Packaging and Circuits Association (JPCA), which specify mass production quality indicators for assemblies such as CAF, insulation degradation, and solder heat resistance.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--cyan-bluish-gray);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/lv124\/\" data-tooltip=\"\u81ea\u52d5\u8eca\u7528\u96fb\u5b50\u90e8\u54c1\u4fe1\u983c\u6027\u8a66\u9a13\u898f\u683c\" aria-label=\"LV124 Reliability Test Standard for Automotive Electronic Components\">LV124<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/lv124\/\">Reliability Test Standard for Automotive Electronic Components<\/a><\/td><td>LV124 is a European automaker-led standard for evaluating automotive electronic components and specifies verification of functional maintenance and failure modes under harsh environmental conditions and power fluctuations.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/mil-std-202\/\" data-tooltip=\"\u96fb\u5b50\u90e8\u54c1\u8a66\u9a13\u898f\u683c\" aria-label=\"MIL-STD-202 Electronic Components Test Standard\">MIL-STD-202<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/mil-std-202\/\">Electronic Components Test Standards<\/a><\/td><td>MIL-STD-202 is a set of test methods for electronic components for the U.S. military, which specifies that environmental, mechanical, and electrical tests should be systematized to provide quality standards for high-reliability applications.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--neutral);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/mil-std-331\/\" data-tooltip=\"\" aria-label=\"MIL-STD-331 \">MIL-STD-331<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/mil-std-331\/\">MIL-STD-331<\/a><\/td><td><\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--neutral);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/mil-std-750\/\" data-tooltip=\"\" aria-label=\"MIL-STD-750 \">MIL-STD-750<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/mil-std-750\/\">MIL-STD-750<\/a><\/td><td><\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/mil-std-810\/\" data-tooltip=\"\u7c73\u56fd\u8ecd\u7528\u74b0\u5883\u8a66\u9a13\u898f\u683c\" aria-label=\"MIL-STD-810G U.S. Military Environmental Test Standard\">MIL-STD-810G<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/mil-std-810\/\">U.S. Military Environmental Test Standards<\/a><\/td><td>MIL-STD-810 is an environmental test standard established by the U.S. Department of Defense that specifies test methods for actual operational environments, including high and low temperatures, vibration, and shock.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/mil-std-883\/\" data-tooltip=\"\u7c73\u56fd\u8ecd\u7528\u534a\u5c0e\u4f53\u8a66\u9a13\u898f\u683c\" aria-label=\"MIL-STD-883 U.S. Military Semiconductor Test Standard\">MIL-STD-883<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/mil-std-883\/\">U.S. Military Semiconductor Test Standards<\/a><\/td><td>MIL-STD-883 is the U.S. Department of Defense's environmental test standard for semiconductor devices and specifies methods for temperature cycling and shock.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--luminous-vivid-amber);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/un-38-3\/\" data-tooltip=\"\u56fd\u9023\u8f38\u9001\u898f\u5247\uff0d\u30ea\u30c1\u30a6\u30e0\u96fb\u6c60\u8a66\u9a13\" aria-label=\"UN 38.3 UN Transport Regulations - Lithium Battery Testing\">UN 38.3<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/un-38-3\/\">UN Transport Regulations - Lithium Battery Testing<\/a><\/td><td>UN 38.3 is a mandatory transport safety test prior to air and land transport, and stipulates that safety must be confirmed under conditions of temperature, low pressure, vibration, shock, and short circuit to determine shipping conformity.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--vivid-green-cyan);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/vda-233-102\/\" data-tooltip=\"\u81ea\u52d5\u8eca\u7528\u63a5\u7d9a\u90e8\u54c1\u8a66\u9a13\u898f\u683c\" aria-label=\"VDA 233-102 Test Standard for Automotive Connected Parts\">VDA 233-102<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/vda-233-102\/\">Automotive Connected Parts Testing Standards<\/a><\/td><td>VDA 233-102 is a connector evaluation standard by the German Association of the Automotive Industry, which specifies that contact stability and life should be verified under vibration, temperature, and corrosion environments.<\/td><\/tr><tr><td><span class=\"std-chip\" style=\"background-color:var(--wp--preset--color--neutral);\"><a href=\"https:\/\/etac.jp\/en\/test_standard\/vg-95210\/\" data-tooltip=\"\" aria-label=\"VG 95210 \">VG 95210<\/a><\/span><\/td><td><a href=\"https:\/\/etac.jp\/en\/test_standard\/vg-95210\/\">VG 95210<\/a><\/td><td><\/td><\/tr><\/tbody><\/table>\n<\/div>\n<\/div><\/div>","protected":false},"excerpt":{"rendered":"<p>Products<\/p>","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":9,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"_uag_custom_page_level_css":"","_swt_meta_header_display":false,"_swt_meta_footer_display":false,"_swt_meta_site_title_display":false,"_swt_meta_sticky_header":false,"_swt_meta_transparent_header":false,"spectra_gs_classes":"","footnotes":""},"class_list":["post-22790","page","type-page","status-publish","hentry"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.5 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>\u8a66\u9a13\u898f\u683c\u4e00\u89a7 - ETAC<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, 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